Ultrathin films of NaCl on Cu(111) have been studied with low-energy electr
on diffraction (LEED) and Dynamic force microscopy (DFM). The orientation a
nd the lattice constant of the films are revealed by LEED while DFM allows
a real space view on their growth modes. The ability of the DFM to image lo
cal mechanical surface properties is demonstrated at a substrate step which
is covered by a continuous NaCl film. (C) 1999 Elsevier Science B.V. All r
ights reserved.