Properties of electrodeposited Ni/Cu multilayer structures

The interface structure and magnetic properties of electrodeposited Ni/Cu m ultilayers have been investigated. The layer thickness of both Cu and Ni ra nge from 200 to 6000 Angstrom. The Ni and the Cu layers are polycrystalline with a dominant (111) fibre texture. The magnetization and M-H loops of th e samples were determined using a vibrating sample magnetometer (VSM). Ferr omagnetic resonance (FMR) was observed at 9.8 GHz. The linewidth of the gra nular multilayer is attributed either to some roughness or to small fluctua tions of magnetization and is about 1.5 kOe when the applied magnetic field is in the plane of the film.