T. Prokscha et al., First mu+SR studies on thin films with a new beam of low energy positive muons at energies below 20 keV, HYPER INTER, 121(1-8), 1999, pp. 569-573
At the Paul Scherrer Institute slow positive muons (mu(+)) with nearly 100%
polarization and an energy of about 10 eV are generated by moderation of a
n intense secondary beam of surface muons in an appropriate condensed gas l
ayer. These epithermal muons are used as a source of a tertiary beam of tun
able energy between 10 eV and 20 keV. The range of these muons in solids is
up to 100 nm which allows the extension of the mu(+) SR techniques (muon s
pin rotation, relaxation, resonance) to the study of thin films. A basic re
quirement for the proper interpretation of mu(+) SR results on thin films a
nd multi- layers is the knowledge of the depth distribution of muons in mat
ter. To date, no data are available concerning this topic. Therefore, we in
vestigated the penetration depth of mu(+) with energies between 8 keV and 1
6 keV in Cu/SiO2 samples. The experimental data are in agreement with simul
ated predictions. Additionally, we present two examples of first applicatio
ns of low energy mu(+) in mu(+) SR investigations. We measured the magnetic
field distribution inside a 500-nm thin High-T-c superconductor (YBa2Cu3O7
-delta), as well as the depth dependence of the field distribution near the
surface. In another experiment a 500-nm thin sample of Fe-nanoclusters (di
ameter 2.4(4) nm), embedded in an Ag matrix with a volume concentration of
0.1%, was investigated with transverse field mu(+) SR.