A novel bidirectional electrooptic network analyzer has been demonstrated w
hich enables the full S-parameter characterization of both electrooptic (E/
O) and optoelectronic (OPE) components using a single connection of the dev
ice-under-test to the test ports. A combined two-tier E/O and O/E calibrati
on is proposed. Measurement results which validate both the analyzer archit
ecture and the calibration are presented.