The next generation of power devices are likely to extend MOS controlled bi
polar (MCB) device concepts to cover very high voltage (up to 8 kV) applica
tions. Such devices will be based on utilizing the advantages brought about
by trench gate MOSFETs to control bipolar current how. In this paper are g
ive a review of development of trench gate IGBTs and we describe briefly ne
w promising device structures based on trench technology which use PIN diod
e and thyristor type carrier distributions to reduce power losses within th
e device.