Fy. Wang et al., Comparative studies on chemical modification of polytetrafluoroethylene slurry in ETV-ICP-AES and ETAAS, J ANAL ATOM, 14(10), 1999, pp. 1619-1624
The chemical modification of polytetrafluoroethylene (PTFE) slurry in elect
rothermal vaporization inductively coupled plasma atomic emission spectrome
try (ETV-ICP-AES) and in electrothermal atomic absorption spectrometry (ETA
AS) was investigated and compared systematically. For both cases, the graph
ite furnace can be used as a chemical reactor in which the fluorinating rea
gent PTFE can convert the oxides of analytes into their volatile fluorides
at high temperature. However, different influences resulting from fluorinat
ion in ETV-ICP-AES and ETAAS were observed owing to different functions of
the graphite furnace in the two techniques. The formation of fluoride enhan
ced the emission signals of the refractory elements Mo, Cr and Yb significa
ntly in ETV-ICP-AES, but only improved the sensitivity of Cr in ETAAS. In b
oth ETV-ICP-AES and ETAAS, the addition of PTFE increased the maximum ashin
g temperature of volatile analyte cadmium. Moreover, PTFE can obviously red
uce or remove the matrix interference and particle size effects of solid sa
mples; this advantage is a benefit in the analysis of complicated samples,
especially for the direct analysis of solid samples.