An electron microscope is a wave optical instrument where the object inform
ation is carried by an electron wave. However, an important information, th
e phase of the electron wave, is lost, because only intensities can be reco
rded in a conventional electron micrograph. Off-axis electron holography so
lves this "phase problem" by encoding amplitude and phase information in an
interference pattern, the so-called hologram. After reconstruction, a rath
er unrestricted. wave optical analysis can be performed on a computer. The
possibilities as well as the current limitations of off-axis electron holog
raphy at atomic dimensions are discussed, and they are illustrated at two a
pplications of structure characterization of epsilon-NbN and YBCO-1237. Fin
ally, an electron microscope equipped with a Cs-corrector, a monochromator,
and a Mollenstedt biprism is outlined for subangstrom holography. (C) Else
vier Science Inc., 1999 All rights reserved.