A retarding field display analyzer, similar to that used in LEED, is discus
sed. It uses four retarding field grids and projects the electron distribut
ion onto a hemispherical phosphor screen. However, this analyzer has no coa
xial electron gun, which permits measurements of electron intensity over a
large angular range. A fiber-optic faceplate projects the hemispherical ima
ge onto a plane, where the light intensity is measured ex situ with a ki,oh
dynamic range CCD camera. This analyzer is optimized for angle-resolved Au
ger and photoemission spectroscopy. We evaluate the effectiveness of this a
nalyzer for the measurement of angle-resolved diffraction patterns for use
in electron holography. (C) Elsevier Science Inc., 1999. All rights reserve
d.