45th International Field Emission Symposium on Atom Probe Microanalysis and Techniques - Preface

Citation
M. Mousa et F. Danoix, 45th International Field Emission Symposium on Atom Probe Microanalysis and Techniques - Preface, MAT SCI E A, 270(1), 1999, pp. IX-X
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN journal
09215093 → ACNP
Volume
270
Issue
1
Year of publication
1999
Pages
IX - X
Database
ISI
SICI code
0921-5093(19990915)270:1<IX:4IFESO>2.0.ZU;2-3