Atom probe field ion microscopy in investigation of the early interreaction stages in Al/Ni couples

Citation
T. Jeske et al., Atom probe field ion microscopy in investigation of the early interreaction stages in Al/Ni couples, MAT SCI E A, 270(1), 1999, pp. 64-68
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN journal
09215093 → ACNP
Volume
270
Issue
1
Year of publication
1999
Pages
64 - 68
Database
ISI
SICI code
0921-5093(19990915)270:1<64:APFIMI>2.0.ZU;2-G
Abstract
In order to obtain a deeper understanding of the mechanisms of the early st ages of interreaction, atom probe field ion microscopy (APFIM) investigatio ns where performed on Al-Ni-interreaction couples in the as-prepared state, and on couples annealed at 350 and 550 degrees C. The couples consisted of a Ni-FIM-tip and an deposited Al-layer. Al-deposition was performed by e(- )-beam evaporation directly in the microscope vacuum chamber. APFIM measure ments allow the identification of different phases after specimen annealing and reveal a microstructure dependency of the early stages of interreactio n. (C) 1999 Elsevier Science S.A. All rights reserved.