Yn. Cheblukov et al., Quantitative scanning tunneling microscopy of radiation-induced modification of materials surface, MAT SCI E A, 270(1), 1999, pp. 102-106
Quantitative analysis of surface profiles of solids after their exposure to
various external effects is described. Highly oriented pyrolytic graphite
(HOPG) samples have been irradiated by proton beams and by ions of SiO2 las
er plasma. The utilized plasma had unique intensity characteristics. A valu
e of fractal dimension is suggested as a quantitative characteristic of the
degree of radiation modification of the surface. (C) 1999 Elsevier Science
S.A. All rights reserved.