Quantitative scanning tunneling microscopy of radiation-induced modification of materials surface

Citation
Yn. Cheblukov et al., Quantitative scanning tunneling microscopy of radiation-induced modification of materials surface, MAT SCI E A, 270(1), 1999, pp. 102-106
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN journal
09215093 → ACNP
Volume
270
Issue
1
Year of publication
1999
Pages
102 - 106
Database
ISI
SICI code
0921-5093(19990915)270:1<102:QSTMOR>2.0.ZU;2-X
Abstract
Quantitative analysis of surface profiles of solids after their exposure to various external effects is described. Highly oriented pyrolytic graphite (HOPG) samples have been irradiated by proton beams and by ions of SiO2 las er plasma. The utilized plasma had unique intensity characteristics. A valu e of fractal dimension is suggested as a quantitative characteristic of the degree of radiation modification of the surface. (C) 1999 Elsevier Science S.A. All rights reserved.