AUGER-PROCESS-INDUCED CHARGE SEPARATION IN SEMICONDUCTOR NANOCRYSTALS

Citation
Vi. Klimov et Dw. Mcbranch, AUGER-PROCESS-INDUCED CHARGE SEPARATION IN SEMICONDUCTOR NANOCRYSTALS, Physical review. B, Condensed matter, 55(19), 1997, pp. 13173-13179
Citations number
34
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
55
Issue
19
Year of publication
1997
Pages
13173 - 13179
Database
ISI
SICI code
0163-1829(1997)55:19<13173:ACSISN>2.0.ZU;2-L
Abstract
Femtosecond nonlinear transmission techniques are applied to study mec hanisms for optical nonlinearities and ultrafast carrier dynamics in C dS nanocrystals (NC's). The obtained data indicate the change in a dom inant hole relaxation channel at high pump levels where nonlinear reco mbination effects start to play a significant role. This is manifested as a distinct difference in nonlinear-optical responses measured at l ow and high pump intensities in quasiequilibrium at long times after e xcitation. The analysis of the wavelength and time dependence of the n onlinear transmission over a wide pump-intensity range shows clearly t hat this difference is due to an Auger-process-assisted trapping of ho les at surface/interface-related states. This trapping leads to effici ent charge separation and the generation of a dc electric field that m odifies the nonlinear optical response in NC's at high pump intensitie s.