The intentional addition of small amounts of nitrogen to different C/H/O ga
s systems in microwave plasma-assisted deposition of diamond films at low s
ubstrate temperatures has been studied. The effect on growth is qualitative
ly different for gas mixtures with or without oxygen. Adding nitrogen to C/
H mixtures results in a significant change of film morphology, growth rate,
defect formation and incorporation of hydrogen. The film quality seriously
deteriorates with increasing nitrogen concentration in the gas phase. The
influence of nitrogen on gas phase processes has been monitored by optical
emission spectroscopy. There is evidence that nitrogen affects growth prima
rily by surface related mechanisms. By contrast, its effect on growth from
CO-rich C/H/O systems is much less pronounced. These films show a constant
quality and a lower defect content. The interaction of nitrogen and oxygen
in low temperature growth of diamond films has been thoroughly examined for
gas mixtures containing comparatively low oxygen fractions. The presence o
f oxygen effectively counteracts the deleterious effect of nitrogen on the
formation of defects. Elastic recoil detection has shown, however, that the
incorporation of nitrogen into the film always increases when its gas phas
e concentration is raised, no matter which gas system is chosen. (C) 1999 E
lsevier Science S.A. All rights reserved.