Preparation and characterization of oriented thin films of a sulfur-nitrogen radical

Authors
Caro, J Fraxedas, J Santiso, J Figueras, A Rawson, JM Smith, JNB Antorrena, G Palacio, F
Citation
J. Caro et al., Preparation and characterization of oriented thin films of a sulfur-nitrogen radical, THIN SOL FI, 352(1-2), 1999, pp. 102-106
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
352
Issue
1-2
Year of publication
1999
Pages
102 - 106
Database
ISI
SICI code
0040-6090(19990908)352:1-2<102:PACOOT>2.0.ZU;2-Z
Abstract
Highly oriented thin films of the organic radical p-NC.C6F4.CNSSN have been prepared by thermal evaporation in high vacuum on glass and on highly orie nted pyrolytic graphite (HOPG) substrates, The films are polycrystalline an d crystallize in one of the known polymorphs, in the triclinic alpha-phase. The films exhibit a high degree of orientation with their (112) planes par allel to the surface of the substrates. No inplane texture is observed. (C) 1999 Elsevier Science S.A. All rights reserved.