We demonstrate a general approach to identify and locate minority species a
t buried interfaces which are of fundamental interest in many fields of sol
id state research. The approach combines soft x-ray emission for bulk and p
hotoelectron spectroscopy for surface sensitivity. In the present study, th
e interface between a thin CdS layer and a Cu(In, Ga)Se-2 thin film solar c
ell absorber has been investigated, showing that Na impurities are localize
d at the buried CdS/Cu(In, Ga)Se-2 heterojunction. (C) 1999 American Instit
ute of Physics. [S0003-6951(99)02740-0].