Microwave and hot filament chemical vapor deposition processes were combine
d to deposit highly oriented and textured diamond films on Si (100). The se
quential growth process yields closely packed crystallites with (100) surfa
ces that show no grain boundaries over areas of up to 60 000 mu m(2) by sca
nning electron microscopy. The diamond crystallites have the same orientati
on as the Si (100) substrate and their orientational order and surface qual
ity as measured by low energy electron diffraction is comparable to that of
single crystal diamond. Micro-Raman spectroscopy confirms the exceptional
quality of the film surface by the complete absence of a luminescence backg
round as well as the absence of spectral features attributed to nondiamond
carbon phases. (C) 1999 American Institute of Physics. [S0003- 6951(99)0384
0-1].