Structure control and characterization of SrBi2Ta2O9 thin films by a modified annealing method (vol 74, pg 1221, 1999)

Citation
Gd. Hu et al., Structure control and characterization of SrBi2Ta2O9 thin films by a modified annealing method (vol 74, pg 1221, 1999), APPL PHYS L, 75(14), 1999, pp. 2151-2151
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
14
Year of publication
1999
Pages
2151 - 2151
Database
ISI
SICI code
0003-6951(19991004)75:14<2151:SCACOS>2.0.ZU;2-O