In this study, the effect of Al on the electrical membrane potential (Em) o
f outer cortex root cells of three-day-old maize seedlings has been studied
. The Em values of root cells ranged between -115 and -146 mV. Em of older
cells towards the root base was considerably more negative than that of the
young root tip cells. Experiments with NaCN + SHAM revealed that the diffu
sion potential (E-D) of root tip cells is smaller than that of root base ce
lls. In short term experiments Em has been rapidly and significantly depola
rized by Al. The depolarization was concentration dependent and reached the
maximum at 150 mu M Al. The extent of membrane depolarization by 100 mu M
Al decreased continuously from the apex to the base of the root. Simultaneo
usly, the number of cells without any response to Al considerably increased
in the region from 10 to 35 mm behind the root tip. Interestingly, this ap
parent insensitivity correlated well with the differentiation of the known
maize root exodermis. No Em changes have been observed in cells more distan
t than 40 mm from apex. The sensitivity of the cells to Al decreased in rad
ial direction and when the tip of the microelectrode reached the interior o
f the central cylinder Al induced no Em changes. Both the P-ATPase activato
r fusicoccin (FC) and glucose diminished the depolarizing effect of Al on E
m. Exposure of roots to Al treatment retarded K+ efflux from root tip segme
nts and had no effect on K+ efflux from segments of the root base. The pres
ent results suggest that, in short-term experiments, Al does not directly a
ffect the electrogenic plasma membrane H+ ATPase.