Scanning tunneling microscopy: Applications to the study of ordered and disordered conducting solid surfaces

Citation
L. Vazquez et al., Scanning tunneling microscopy: Applications to the study of ordered and disordered conducting solid surfaces, CHARACTERIZATION TECHNIQUES OF GLASSES AND CERAMICS, 1999, pp. 17-40
Categorie Soggetti
Current Book Contents
Year of publication
1999
Pages
17 - 40
Database
ISI
SICI code