Near infrared wavemeter in polycrystalline germanium on silicon

Citation
G. Masini et al., Near infrared wavemeter in polycrystalline germanium on silicon, ELECTR LETT, 35(18), 1999, pp. 1549-1551
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
35
Issue
18
Year of publication
1999
Pages
1549 - 1551
Database
ISI
SICI code
0013-5194(19990902)35:18<1549:NIWIPG>2.0.ZU;2-C
Abstract
A novel solid-stale device for the spectral analysis of near infrared light is presented. The device is an array of six photodetectors in polycrystall ine Ge on Si, each element being wavelength selective. The fabrication, cha racterisation and demonstration of the device both as a wavelength meter an d spectrum analyser are presented.