Calculation of differential reflection coefficient for isolated microscopic well structure

We have calculated differential reflection coefficient for isolated well st ructure of micro-scale, etched on dielectric surface. The differential refl ection coefficient is computed using Green's second integral theorem. The p urpose of our computation is to find a class of well profiles which give ma ximal diffusive scattering. To have such a maximal effect we have concluded that the waist radius of Gaussian beam and its wavelength should be compar able to the well width and that well depth has to be larger than a wave len gth. Exact calculation of differential reflection coefficients of dielectri c surface with isolated structure on it may be used for the examination of dielectric surfaces and also in making simple but efficient diffuser.