Ferromagnetic MnSb thin films were grown on CdTe (110) substrates for
the first time by hot-wall epitaxy (HWE) technique using polycrystalli
ne powders of MnSb as an evaporation source. The crystal orientation o
f these thin films was determined by X-ray diffractometry (XRD). The c
hemical composition of the films was determined by means of electron-p
robe microanalysis (EPMA) and by electron spectroscopy for chemical an
alysis (ESCA) depth profiling. Polar magnetooptical Kerr rotation spec
tra were measured in the 1.2 eV to 4 eV photon energy range.