Closed space RFI testing

Authors
Citation
Im. Bell, Closed space RFI testing, IEEE CONS E, 45(3), 1999, pp. 860-866
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON CONSUMER ELECTRONICS
ISSN journal
00983063 → ACNP
Volume
45
Issue
3
Year of publication
1999
Pages
860 - 866
Database
ISI
SICI code
0098-3063(199908)45:3<860:CSRT>2.0.ZU;2-S
Abstract
An efficient closed space RFI testing method has been developed to assure competitiveness of the new designs. This paper discusses the RFI testing philosophy as well as development considerations regarding procedur e, presentation of results and acceptance criteria.