5d and 4f magnetic profiles in Ce/Fe multilayers probed by XRMS

The element and electronic shelf specificities of x-ray resonant magnetic s cattering have been used to investigate the induced magnetization of the 5d and 4f electronic states of Ce in a [Ce(10 Angstrom)/Fe(30 Angstrom)] x 10 0 multilayer. We show that the measurement of the magnetic contribution to the intensities diffracted at low angles at the L-2 and M-4 edge of the rar e-earth allows to investigate the profile of the 5d and 4f magnetic polaris ation across the rare-earth layer. The Ce 5d polarization is found to be os cillating across the Ce layer with a slow decrease from the interfaces with Fe towards the center of the layer. Preliminary results on the Ce 4f polar isation indicate a constant profile.