We revealed the existence of a very thin (similar to 50 Angstrom thick) epi
taxial. iron-oxide interlayer in amorphous Ba-ferrite thin films on sapphir
e(001) using synchrotron x-ray scattering. Depending on the sputtering gase
s used in radio frequency sputtering deposition, two different iron-oxide i
nterlayers were formed; non-magnetic alpha-Fe2O3 interlayer by pure Ar gas
and ferromagnetic Fe3O4 interlayer by Ar-10% O-2 gas mixture. The alpha-Fe2
O3 interlayer much more promoted the crystallization of amorphous Ba-ferrit
e, compared to the Fe3O4 interlayer. We suggest that the interlayer existin
g between amorphous Ba-ferrite and sapphire substrate greatly contributes t
o the reduction of the activation energy for the crystallization of amorpho
us Baferrite film.