CW laser-induced fluorescence study of SiH2+SiH4 reaction: Dominance of two-body reaction channel in low-pressure silane plasma
Citation
A. Kono et al., CW laser-induced fluorescence study of SiH2+SiH4 reaction: Dominance of two-body reaction channel in low-pressure silane plasma, JPN J A P 1, 38(7B), 1999, pp. 4389-4392
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Abstract
The decay of the SiH2 density in the afterglow of low-pressure SiH4 plasma
was studied by laser-induced fluorescence spectroscopy using a cw dye laser
. Pressure dependence of the SiH2 loss rate in SiH4/H-2 mixture plasma indi
cates that at low pressures (less than or similar to 40 mTorr) the SiH2+SiH
4 reaction mainly occurs at a rate constant of similar to 4 x 10(-11) cm(3)
s(-1) via a two-body process, presumably yielding Si2H4+H-2, and not via th
e three-body association process yielding Si2H6, which is dominant at high
pressures a hydrogen molecule is found to be an inefficient third body prom
oting the three-body association process. When SiH4 is diluted with H-2 so
that the SiH4 fraction is below similar to 10% with a fixed total SiH4/H-2
pressure of 60 mTorr, the transport to the wall becomes the dominant SiH2 l
oss process in the reactor geometry of 3-cm spaced parallel-plate electrode
s; the transport loss rate of SiH2 in this condition is close to the free-f
all limit because of small momentum transfer in collisions between SiH2 and
H-2.