Temperature dependence of exciton peak energies in ZnS, ZnSe, and ZnTe epitaxial films

Citation
R. Passler et al., Temperature dependence of exciton peak energies in ZnS, ZnSe, and ZnTe epitaxial films, J APPL PHYS, 86(8), 1999, pp. 4403-4411
Citations number
49
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
8
Year of publication
1999
Pages
4403 - 4411
Database
ISI
SICI code
0021-8979(19991015)86:8<4403:TDOEPE>2.0.ZU;2-S
Abstract
High-quality ZnS, ZnSe, and ZnTe epitaxial films were grown on (001)-GaAs-s ubstrates by molecular beam epitaxy. The 1s-exciton peak energy positions h ave been determined by absorption measurements from 2 K up to about room te mperature. For ZnS and ZnSe additional high-temperature 1s-exciton energy d ata were obtained by reflectance measurements performed from 300 up to abou t 550 K. These complete E-1s(T) data sets are fitted using a recently devel oped analytical model. The high-temperature slopes of the individual E-1s(T ) curves and the effective phonon temperatures of ZnS, ZnSe, and ZnTe are f ound to scale almost linearly with the corresponding zero-temperature energ y gaps and the Debye temperatures, respectively. Various ad hoc formulas of Varshni type, which have been invoked in recent articles for numerical sim ulations of restricted E-1s(T) data sets for cubic ZnS, are discussed. (C) 1999 American Institute of Physics. [S0021-8979(99)06420-8].