Hole initiated impact ionization in wide band gap semiconductors

Citation
M. Reigrotzki et al., Hole initiated impact ionization in wide band gap semiconductors, J APPL PHYS, 86(8), 1999, pp. 4458-4463
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
8
Year of publication
1999
Pages
4458 - 4463
Database
ISI
SICI code
0021-8979(19991015)86:8<4458:HIIIIW>2.0.ZU;2-Q
Abstract
Band-to-band impact ionization by hot electrons and holes is an important p rocess in high-field transport in semiconductors, leading to carrier multip lication and avalanche breakdown. Here we perform first principles calculat ions for the respective microscopic scattering rates of both electrons and holes in various wide band gap semiconductors. The impact ionization rates themselves are calculated directly from the electronic band structure deriv ed from empirical pseudopotential calculations for cubic GaN, ZnS, and SrS. In comparison with the electron rates, a cutoff in the hole rate is found due to the relatively narrow valence bandwidths in these wide band gap semi conductors, which correspondingly reduces hole initiated carrier multiplica tion. (C) 1999 American Institute of Physics. [S0021-8979(99)08419-4].