Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms

Authors
Hwu, Y Hsieh, HH Lu, MJ Tsai, WL Lin, HM Goh, WC Lai, B Je, JH Kim, CK Noh, DY Youn, HS Tromba, G Margaritondo, G
Citation
Y. Hwu et al., Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms, J APPL PHYS, 86(8), 1999, pp. 4613-4618
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
8
Year of publication
1999
Pages
4613 - 4618
Database
ISI
SICI code
0021-8979(19991015)86:8<4613:CSRRVD>2.0.ZU;2-O
Abstract
Tests performed in different regimes reveal the interplay of two edge-enhan cement mechanisms in radiological images taken with coherent synchrotron li ght. The relative weight of the two mechanisms, related to refraction and t o Fresnel edge diffraction, can be changed in a controlled way. This makes it possible to obtain different images of the same object with complementar y information. (C) 1999 American Institute of Physics. [S0021-8979(99)03720 -2].