Soft x-ray photoionization and fragmentation of SO2 studied by threshold photoelectron-photoion-photoion coincidence (TPEPIPICO) spectroscopy

The photoionization of SO2 has been studied in the photon energy range 160- 560 eV using the SRS at Daresbury Laboratory, UK. Threshold photoelectron a nd total ion-yield spectra are presented in the region of the S 2p and O 1s edges. Ion branching ratios are obtained from threshold photoelectron-phot oion coincidence (TPEPICO) data and the detailed dynamics of the fragmentat ion process determined using the threshold photoelectron-photoion-photoion coincidence (TPEPIPICO) technique. The data are compared with other results at the S 2p edges, and with previous studies of SO2 in the vacuum ultravio let spectral region.