An optical device was constructed to collect near-field Raman spectra (NFRS
) and far-field scattering Raman spectra simultaneously on the same sample
area. In Raman applications where the studied samples do not enjoy any adva
ntages of resonance effects, the nanoprobe may be used only as a nanodetect
or in order to avoid damage of the tip by the necessary laser powers. The s
ilicon-based samples, which are either calibrated grid or a single crystal,
were studied by NFRS and conventional scattering Raman spectroscopy, The n
ear-field Raman signal of silicon is divided by at least four when the tip-
silicon substrate distance is separated by a 100 nm layer of oxide. Moreove
r, between the NFR spectrum and the far-field spectrum, on the single cryst
al, a shift of about 10 cm(-1) is displayed. Some interpretations are discu
ssed. These experiments confirm the potential of the NFRS already emphasize
d previously in the literature. Copyright (C) 1999 John Wiley & Sons, Ltd.