An innovative method for device characterization is developed to qualify mi
croelectronic devices. The method is based on parameter extraction from the
junction I-V characteristics. Their evolution during electrical aging and
ionizing radiation experiments allows an evaluation of the magnitude of the
degradation. Results obtained with commercial samples show a signature of
both manufacturer and technological processes. This method is easy to imple
ment in a control process for device characterization. (C) 1999 Elsevier Sc
ience Ltd. All rights reserved.