Transient induced latch-up triggered by very fast pulses

The sensitivity of devices to latch-up triggered by short duration pulses i s an often overlooked root cause for severe field failures. Standard JEDEC1 7 tests applying quasi-static voltages and currents often fail to identify these problems. In addition, nide pulses may cause thermal damage in the de vice before it triggers. In this paper we introduce a new analytical test t echnique on the basis of very fast square pulses. The method allows the ins itu monitoring of the voltages and currents at the DUT during triggering an d helps to gain fundamental insights into the underlying mechanisms. (C) 19 99 Elsevier Science Ltd. All rights reserved.