Validation of radiation hardened designs by pulsed laser testing and SPICEanalysis

Authors
Pouget, V Lewis, D Lapuyade, H Briand, R Fouillat, P Sarger, L Calvet, MC
Citation
V. Pouget et al., Validation of radiation hardened designs by pulsed laser testing and SPICEanalysis, MICROEL REL, 39(6-7), 1999, pp. 931-935
Citations number
6
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
39
Issue
6-7
Year of publication
1999
Pages
931 - 935
Database
ISI
SICI code
0026-2714(199906/07)39:6-7<931:VORHDB>2.0.ZU;2-4
Abstract
A new pulsed laser system dedicated to the simulation of radiation effects on integrated circuits is presented. On-line testing capabilities are detai led and two SPICE models of radiation induced transient currents are propos ed to be used for results analysis. (C) 1999 Elsevier Science Ltd. All righ ts reserved.