Evaluation of P-HEMT MMIC technology PH25 for space applications

Authors
Huguet, P Auxemery, P Pataut, G Garat, F
Citation
P. Huguet et al., Evaluation of P-HEMT MMIC technology PH25 for space applications, MICROEL REL, 39(6-7), 1999, pp. 1049-1054
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
39
Issue
6-7
Year of publication
1999
Pages
1049 - 1054
Database
ISI
SICI code
0026-2714(199906/07)39:6-7<1049:EOPMTP>2.0.ZU;2-6
Abstract
The evaluation of the P-HEMT technology PH25 according to the European Spac e Agency requirements is presented. The reliability assessment plan feature s high temperature storage tests, DC life-tests and RF life-tests, performe d on a set of evaluation test vehicles specifically defined for this purpos e. The results of these tests evidence a temperature activated wear-out mec hanism, a very low sensitivity of PH25 on strong RF stress and no sensitivi ty on hydrogen. Failure rates calculations are in line with the space progr amme requirements. (C) 1999 Elsevier Science Ltd. All rights reserved.