Citation
M. Vanzi et al., A simpler method for life-testing laser diodes, MICROEL REL, 39(6-7), 1999, pp. 1067-1071
Citations number
2
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714
→ ACNP
Volume
39
Issue
6-7
Year of publication
1999
Pages
1067 - 1071
Database
ISI
SICI code
0026-2714(199906/07)39:6-7<1067:ASMFLL>2.0.ZU;2-1
Abstract
The procedure of measuring the I(V) characteristics of laser diodes at fixe
d time steps of a constant current life-test is revised. The possibility of
using the test equipment itself to extract the characteristics is investig
ated and demonstrated. This eliminates the most troublesome manual procedur
e in life-testing several devices. (C) 1999 Elsevier Science Ltd. All right
s reserved.