Long term Reliability Testing of HV-IGBT modules in worst case traction operation

Citation
L. Fratelli et al., Long term Reliability Testing of HV-IGBT modules in worst case traction operation, MICROEL REL, 39(6-7), 1999, pp. 1137-1142
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
39
Issue
6-7
Year of publication
1999
Pages
1137 - 1142
Database
ISI
SICI code
0026-2714(199906/07)39:6-7<1137:LTRTOH>2.0.ZU;2-V
Abstract
High reliability level is required for IGBT modules used in power converter s in railway traction application which however are subject to high stress because of the typical cycling operation which causes thermomechanical fati gue. The paper reports about Ansaldo Trasporti activity in IGBT's reliabili ty testing. Facility simulating worst case traction operation is described and the result after operation is presented: due to such stressing action, a solder delamination at the baseplate seems to be the first failure mechan ism to be excited. (C) 1999 Elsevier Science Ltd. All rights reserved.