Geometric micron-moire

Authors
Citation
Fl. Dai et Zy. Wang, Geometric micron-moire, OPT LASER E, 31(3), 1999, pp. 191-198
Citations number
8
Categorie Soggetti
Optics & Acoustics
Journal title
OPTICS AND LASERS IN ENGINEERING
ISSN journal
01438166 → ACNP
Volume
31
Issue
3
Year of publication
1999
Pages
191 - 198
Database
ISI
SICI code
0143-8166(199903)31:3<191:GM>2.0.ZU;2-P
Abstract
A high spatial resolution and high-sensitivity geometric micron-moire metho d is presented. The method is based upon classical geometric moire method a nd microscopic principle, the frequency of the specimen and reference grati ngs used in this method can be higher than 1000 lines/mm. By a microscopic moire system, the high-frequency gratings could be magnified to a low-frequ ency level, so geometric moire patterns can be formed. Experiments show tha t both the spatial resolution and the sensitivity can reach or exceed micro n-level. (C) 1999 Elsevier Science Ltd. All rights reserved.