Hydrogen-desorption kinetic measurement on the Si(100)-2x1 : H surface by directly counting desorption sites

Authors
Citation
Ds. Lin et Rp. Chen, Hydrogen-desorption kinetic measurement on the Si(100)-2x1 : H surface by directly counting desorption sites, PHYS REV B, 60(12), 1999, pp. R8461-R8464
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
60
Issue
12
Year of publication
1999
Pages
R8461 - R8464
Database
ISI
SICI code
0163-1829(19990915)60:12<R8461:HKMOTS>2.0.ZU;2-#
Abstract
The desorption kinetics of hydrogen from the Si(100)-2x1:H monohydride surf ace was investigated by means of variable-temperature scanning-tunneling mi croscopy (STM) in the temperature range between 590 and 668 K. By directly counting the number of desorption sites in the STM images for various annea ling time at several temperatures, an activation barrier of E-d = 2.22+/-0. 20 eV and a pre-exponential factor of nu(d) = 3.4 x 10(13+/-0.3) s(-1) for the H-2 recombinative desorption are deduced. The sequential images acquire d in real times show that hydrogen desorbs in a random manner and the inter action between two neighboring paired dangling bond sites is repulsive.