MEASUREMENT OF MODE FIELD PROFILES AND BENDING AND TRANSITION LOSSES IN CURVED OPTICAL CHANNEL WAVE-GUIDES

Curved, single-mode, silicon oxynitride optical ridge channel waveguid es have been characterized by measuring mode field profile alteration, bending loss, and transition loss, The results were compared to theor etical calculations, Near field imaging of the channel mode field prof iles showed the effect of bend radius on mode shape, Good agreement wa s obtained between the measurements and profiles obtained from two-dim ensional (2-D) beam propagation method calculations, The exponential d ependence of bending loss on bend radius and the variation of transiti on loss on the lateral offset between channels having different bend r adius were successfully modeled by two simple theories.