Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy

Authors
Muller, AD Muller, F Hietschold, M Demming, F Jersch, J Dickmann, K
Citation
Ad. Muller et al., Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy, REV SCI INS, 70(10), 1999, pp. 3970-3972
Citations number
9
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
70
Issue
10
Year of publication
1999
Pages
3970 - 3972
Database
ISI
SICI code
0034-6748(199910)70:10<3970:COEETT>2.0.ZU;2-S
Abstract
Shape and composition of electrochemically etched tungsten tips for use in scanning tunneling microscopy (STM) were investigated in a transmission ele ctron microscope (TEM) with a Gathan imaging filter (GIP). The tips are pre pared by a lamella drop-off technique. We observe typical tip radii of less than 10 nm. After a storage of some days under ambient conditions, an amor phous oxide film is detectable. The electron energy-loss spectroscopy confi rms that the surface is contaminated by compounds that contain carbon, too. (C) 1999 American Institute of Physics. [S0034- 6748(99)01110-7].