Temperature influence on the exaltation effect of mass transport of metal ions at their accumulation in the rigid mode of inverse voltammetry

The effect of the Joule heating of the near-electrode layer on the metal ac cumulation rate in the inverse voltammetry by applying high (up to 1000 V) voltages V-H between the indicator and counter electrodes is studied by num erically solving the electrodiffusion problem at different diffusion coeffi cients for reagents and diffusion layer thicknesses. The exaltation phenome na (effects associated with the necessity to maintain local electroneutrali ty in the near-cathode layer) contribute significantly to the mass transpor t of discharging metal ions at high current densities by hydrogen i(2) Sinc e the anion generation rate at the electrode surface depends only on i(2), the transport of metal ions neutralizing the charge of anions depends prima rily on i(2) and, to a much lesser extent, on the temperature and stirring.