Effect of surface recombination on the Early voltage in HBTs

Citation
Sy. Chiu et Afm. Anwar, Effect of surface recombination on the Early voltage in HBTs, SEMIC SCI T, 14(9), 1999, pp. 840-847
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
14
Issue
9
Year of publication
1999
Pages
840 - 847
Database
ISI
SICI code
0268-1242(199909)14:9<840:EOSROT>2.0.ZU;2-L
Abstract
The effect of surface recombination on the Early voltage in heterojunction bipolar transistors (HBTs) is presented. Calculations are based by invoking the partitioning of the total current into thermionic and tunnelling compo nents. The tunnelling current is computed by using an exact quantum mechani cal calculation. Narrow-base HBTs are simulated by taking into account non- stationary transport in the base. Surface recombination degrades the Early voltage in a uniformly doped base. In tin exponentially doped base a scaled -down base width modulation results in a higher Early voltage. At high base doping levels, the Early voltage is further degraded by neutral base recom bination. Theoretical results are compared with experimental data and the a greements are excellent.