Real-space dynamical simulation for electron microdiffraction effects

Citation
K. Du et al., Real-space dynamical simulation for electron microdiffraction effects, ULTRAMICROS, 80(2), 1999, pp. 99-107
Citations number
14
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ULTRAMICROSCOPY
ISSN journal
03043991 → ACNP
Volume
80
Issue
2
Year of publication
1999
Pages
99 - 107
Database
ISI
SICI code
0304-3991(199910)80:2<99:RDSFEM>2.0.ZU;2-R
Abstract
A microdiffraction pattern is calculated from a translation domain boundary in beta-Ni3Nb with a little crystal tilt by real-space multislice procedur e, which is very similar to the experimental result. By carrying out simula tion, it is revealed that the features of the patterns, such as splitting o r streaking of some spots, are affected by probe position, crystal tilt and probe size. In our case, they are more sensitive to the probe position tha n the crystal tilt and probe size. Any change in thickness in the simulatio n may cause the features to be obviously varied, especially under crystal t ilting. In practice, segmenting of some spots also occurs for a perfect bet a-Ni3Nb crystal, which has been theoretically proved to be due to dynamical diffraction but not probe size. (C) 1999 Elsevier Science B.V. All rights reserved.