Amorphous samples of V2O5 films have been thermally evaporated on unheated
glass substrate with different film thicknesses using high-purity V2O5 powd
er. The structural characteristics of the V2O5 powder as well as a sample o
f 181 nm thickness were investigated using X-ray diffraction. The optical p
roperties of the prepared films were studied by transmittance and reflectan
ce measurements, and the integrated transmittance (T-UV,T-V,T-NIR) and abso
rptance (A(UV), A(V), A(NIR)) in the UV, VIS and NIR regions were calculate
d. They were found to be strongly affected by the film thickness. The depen
dence of absorption coefficient and the refractive index on wavelength for
the prepared sample was also reported. (C) 1999 Elsevier Science Ltd. All r
ights reserved.