Study on some optical properties of thermally evaporated V2O5 films

Citation
Sa. Aly et al., Study on some optical properties of thermally evaporated V2O5 films, VACUUM, 55(2), 1999, pp. 159-163
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
VACUUM
ISSN journal
0042207X → ACNP
Volume
55
Issue
2
Year of publication
1999
Pages
159 - 163
Database
ISI
SICI code
0042-207X(199911)55:2<159:SOSOPO>2.0.ZU;2-R
Abstract
Amorphous samples of V2O5 films have been thermally evaporated on unheated glass substrate with different film thicknesses using high-purity V2O5 powd er. The structural characteristics of the V2O5 powder as well as a sample o f 181 nm thickness were investigated using X-ray diffraction. The optical p roperties of the prepared films were studied by transmittance and reflectan ce measurements, and the integrated transmittance (T-UV,T-V,T-NIR) and abso rptance (A(UV), A(V), A(NIR)) in the UV, VIS and NIR regions were calculate d. They were found to be strongly affected by the film thickness. The depen dence of absorption coefficient and the refractive index on wavelength for the prepared sample was also reported. (C) 1999 Elsevier Science Ltd. All r ights reserved.