In 5 years time inductive coupled plasma sources have invaded the market of
plasma processing. Such plasma sources are characterised by low plasma pot
ential and offer the advantage of independent control of ion energy and ion
flux to the processed surface. In reason of the high plasma density, high
etch rates can be achieved at low pressure and controlled substrate bias, a
necessary condition to meet with today and tomorrow's industrial and techn
ological requirements in microelectronics and microtechnology fabrication.