Ha. Biebuyck et al., LITHOGRAPHY BEYOND LIGHT - MICROCONTACT PRINTING WITH MONOLAYER RESISTS, IBM journal of research and development, 41(1-2), 1997, pp. 159-170
We describe high-resolution lithography based on transfer of a pattern
from an elastomeric ''stamp'' to a solid substrate by conformal conta
ct: a nanoscale interaction between substrate and stamp on macroscopic
scales that allows transport of material from stamp to substrate. The
stamp is first formed by curing poly(dimethyl siloxane) (PDMS) on a m
aster with the negative of the desired surface, resulting in an elasto
meric solid with a pattern of reliefs, typically a few microns deep, o
n its surface. The stamp provides an ''ink'' that forms a self-assembl
ed monolayer (SAM) on a solid surface by a covalent, chemical reaction
. Because SAMs act as highly localized and efficient barriers to some
wet etches, microcontact printing forms part of a convenient lithograp
hic system not subject to diffraction or depth of focus limitations wh
ile still providing simultaneous transfer of patterned features. Our s
tudy helps to define the strengths and limitations of microcontact pri
nting with SAMs, a process that is necessary to assess its worth to te
chnology. We used lithography based on scanning tunneling microscopy (
STM) to demonstrate that disruption of SAMs on gold allowed the format
ion of etched features as small as 20 nm using a CN-/O-2 etch. This re
sult implied that etching occurred where damage of a few molecules in
the ordered SAM allowed passage of cyanide, whereas adjacent molecules
in the SAM remained unperturbed at this scale. Features as small as 3
0 nm etched in gold over areas greater than 1 cm(2) resulted from micr
ocontact printing with replicas of electron-beam-formed masters, with
the transfer of these printed SAMs requiring only approximate to 1 s.
STM studies of these transferred SAMs revealed an achievable order ind
istinguishable from that found for SAMs prepared from solution. Facile
alignment of printing steps at submicron scales may result from new d
esigns of stamps that exploit their limited deformability and lock-and
-key-type approaches to mate stamp and substrate.