High-performance 980-nm quantum-well lasers using a hybrid material systemof an Al-free InGaAs-InGaAsP active region and AlGaAs cladding layers grown by metal-organic chemical vapor deposition
Gw. Yang et al., High-performance 980-nm quantum-well lasers using a hybrid material systemof an Al-free InGaAs-InGaAsP active region and AlGaAs cladding layers grown by metal-organic chemical vapor deposition, IEEE J Q EL, 35(10), 1999, pp. 1535-1541
We report on the material growth and fabrication of high-performance 980-nm
strained quantum-well lasers employing a hybrid material system consisting
of an Al-free InGaAs-InGaAsP active region and AlGaAs cladding layers. The
use of AlGaAs cladding instead of InGaP provides potential advantages in f
lexibility of laser design, simple epitaxial growth, and improvement of sur
face morphology and laser performance. The as-grown InGaAs-InGaAsP(1.6 eV)-
AlGaAs(1.95 eV) lasers achieve a low threshold current density of 150 A/cm(
2) (at a cavity length of 1500 mu m), internal quantum efficiency of simila
r to 95%, and low internal loss of 1.8 cm(-1). Both broad-area and ridge-wa
veguide laser devices are fabricated. For 100-mu m-wide stripe lasers with
a cavity length of 800 Irm, a slope efficiency of 1.05 W/A and a characteri
stic temperature coefficient (T-0) of 230 K are achieved. The lifetime test
demonstrates a reliable performance. The comparison with our fabricated In
GaAs-InGaAsP(1.6 eV)-AlGaAs(1.87 eV) lasers and Al-free InGaAs-InGaAsP (1.6
eV)-InGaP lasers are also given and discussed. The selective etching betwe
en AlGaAs and InGaAsP is successfully used for the formation of a ridge-wav
eguide structure. For 4-mu m-wide ridge-waveguide laser devices, a maximum
output power of 350 mW is achieved. The fundamental mode output power can b
e up to 190 mW with a slope efficiency as high as 0.94 W/A.