New efficient totally self-checking Berger code checkers

This paper presents a new method for designing totally self-checking (TSC) Berger code checkers for any number k of information bits, even for k = 2(r -1), taking into account realistic faults as stuck-at, transistor stuck-ope n, transistor stuck-on and resistive bridging faults. Double- as well as si ngle-output TSC checkers are given. The proposed single-output TSC Berger c ode checkers are the first in the open literature. The checkers designed fo llowing the proposed method are significantly more efficient, with respect to the required area and speed, than the corresponding already known from t he open literature checkers. (C) 1999 Elsevier Science B.V. All rights rese rved.