Formation of < 001 >-aligned nano-scale pores on (001) n-InP surfaces by photoelectrochemical anodization in HCl

Citation
A. Hamamatsu et al., Formation of < 001 >-aligned nano-scale pores on (001) n-InP surfaces by photoelectrochemical anodization in HCl, J ELEC CHEM, 473(1-2), 1999, pp. 223-229
Citations number
21
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTROANALYTICAL CHEMISTRY
ISSN journal
15726657 → ACNP
Volume
473
Issue
1-2
Year of publication
1999
Pages
223 - 229
Database
ISI
SICI code
Abstract
[001]-oriented nanometer sized straight pores without branches were formed for the first time on (001) n-type InP surfaces by photoelectrochemical ano dic reaction in HCl. The pore diameter, wall thickness and pore length coul d be changed in the ranges of 110-250 nm, 16-50 nm and 17-80 mm, respective ly, by changing the anodizing overpotential and time. Based on the diffusio n limited model for porous Si formation, the formation of [001]-aligned str aight pores without branches on n-type InP was explained in terms of the sh ort lifetime of holes combined with the presence of a strong electric held at the pore tip. Contrary to the expectation of blue-shifted photoluminesce nce (PL) emission due to quantum confinement at pore walls, porous (001) In P samples exhibited intense red-shifted PL peaks. This was explained by for mation of a set of well defined new surface state levels on the anodized wa ll surfaces of pores. (C) 1999 Elsevier Science S.A. All rights reserved.